Analyzing a firm’s international portfolio of technological knowledge: A declarative ontology-based OWL approach for patent documents

Authors: Maria Bermudez-Edo, Manuel Noguera, Nuria Hurtado-Torres, Maria Visitacion Hurtado, Jose Luis Garrido

Abstract: 
Patent databases contain large amounts of information about the inventions and metadata of corporate patents (such as the technological domain they belong to, their applicants, and inventors). These databases are available online but since they do not provide explicit information about the relationships between different patent metadata, it is not possible for computers to automatically process such relationships. Several patent ontologies have been proposed so far in order to provide patent knowledge bases with semantics by merging information from different databases and establishing a common vocabulary. However, previous ontology literature has paid limited attention to the representation of specific relationships among metadata and the design of reasoning procedures that would allow some information not explicitly specified in the databases or ontologies to be inferred. This article proposes a methodological approach for the definition of relationships and reasoning tasks for patent analysis by using patent ontologies, and provides a real illustration of its potential in the context of international flows of research knowledge. This declarative method is based on the formal definition of key patent analysis indicators (KPAIs). The case study analysis is relevant because global competition and the importance of multinational firms in the patent process have resulted in firms not only patenting on their domestic markets but also transferring their patents to other markets and developing patents in different countries. In this context, it is important to analyze the connections between the patenting processes and the international knowledge flows of research and development. More specifically, the paper illustrates the applicability of the proposed methodology by classifying patents into the five patterns of internationalization identified by the Organization for Economic Co-operation and Development (OECD).

Keywords:
Ontology
OWL
Patent analysis
Ontology-driven engineering
Ontology engineering
Firm innovation analysis

Published in: Advanced Engineering Informatics (Volume 27, Issue 3, January 2013)

Publisher: Elsevier

ISSN Information: 1474-0346

Analyzing a firm’s international portfolio of technological knowledge: A declarative ontology-based OWL approach for patent documents

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